An estimate of error rates in integrated circuits at aircraft altitudes and at sea level-Reference-Cited by-同舟云学术

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An estimate of error rates in integrated circuits at aircraft altitudes and at sea level

Published:1989-04 Issue: Volume:40-41 Page:1295-1299
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Dicello J.F.,Paciotti M.,Schillaci M.E.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference18 articles.

1. Radiation Protection: 8th Symp. on Microdosimetry;Dicello,1983

2. The Relative Efficiency of Soft-Error Induction in 4K Static RAMS by Muons and Pions

3. Meson Interactions in NMOS and CMOS Static RAMs

4. Microdosimetry: Measured Probabilities for Energy Deposited by Mesons in One-Micron Sites in Silicon

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2. Characterizing SRAM and FF soft error rates with measurement and simulation;Integration;2019-11

3. Negative and Positive Muon-Induced Single Event Upsets in 65-nm UTBB SOI SRAMs;IEEE Transactions on Nuclear Science;2018-08

4. Muon-Induced Single Event Upsets in Deep-Submicron Technology;IEEE Transactions on Nuclear Science;2010-12

5. Pion-induced soft upsets in 16 mbit DRAM chips;IEEE Transactions on Nuclear Science;1997-12

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