Depth-profiling of hydrogen and helium isotopes by means of the ERD E × B technique-Reference-Cited by-同舟云学术

Depth-profiling of hydrogen and helium isotopes by means of the ERD E × B technique

Published:1992-01 Issue:4 Volume:62 Page:484-492
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Ross G.G.,Leblanc L.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference18 articles.

1. Proc. of the 9th Int. Vacuum Congress-5th Int. Conf. on Surf. Science;Terreault,1983

2. Inexpensive, quantitative hydrogen depth-profiling for surface probes

3. G.G. Ross, L. Leblanc, B. Terreault, J.F. Pageau and P.A. Gollier, Proc. 3rd Int. Conf. on Chemical Analysis, 8–12 July 1991, Namur, Belgium, Nucl. Instr. and Meth. B, in press.

4. H−, H0, H+ He0, He+ and He2+ fractions of projectiles scattered from 14 different materials at 30 to 340 keV

5. Charge fractions of deuterium scattered from 17 different materials at 50 to 340 keV

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