Non-Rutherford backscattering analysis of nitrogen content in titanium substrates
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference12 articles.
1. Non-Rutherford 4He cross sections for ion beam analysis
2. Study of oxygen depth distribution in Si1Ox and Mo1Ox films using 4He ion elastic scattering
3. Non-Rutherford elastic backscattering for light element cross section enhancement
4. N14+He4andO16+He3Differential Cross Sections
5. N14(α, α)N14andN14(α, p)O17Differential Cross Sections
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1. Comparative study of proton and helium elastic scatterings from nitrogen in GaN;Materials Science in Semiconductor Processing;2021-01
2. Depth profiling of titanium nitride thin films deposited on stainless steel utilizing combined EBS and NRA techniques;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2018-09
3. Cross-section measurements of the N14(α,p)O17 and N14(α,α)N14 reactions between 3.5 and 6 MeV;Journal of Applied Physics;2008-10-15
4. 14N(α,p)17O nuclear reaction cross-section at 4.9–6.1MeV;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2005-12
5. Measurement of non-Rutherford cross sections of He ions on N at a laboratory backscattering angle of 171° between 7.5 and 9.8 MeV;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2002-05
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