Inverse velocity trends in secondary ion mass spectrometry; a new method for quantification?-Reference-Cited by-同舟云学术

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Inverse velocity trends in secondary ion mass spectrometry; a new method for quantification?

Published:1994-04 Issue:3-4 Volume:86 Page:373-379
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

van der Heide P.A.W.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference29 articles.

1. Evaluation of a cesium positive ion source for secondary ion mass spectrometry

2. Secondary Ion Mass Spectrometry;Wilson,1989

3. Secondary Ion Mass Spectrometry;Benninghoven,1987

4. Practical Surface Analysis;Williams,1992

5. Velocity dependence of secondary-ion emission

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1. Ionization probability of secondary ions sputtered from Si(111) and Ge(111) surfaces;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2011-02

2. Critical distance for secondary ion formation: Experimental SIMS measurements;Applied Surface Science;2008-12

3. Comment on “The ‘infinite velocity method’: a means of concentration calibration in secondary ion mass spectrometry?”;Surface Science;2000-05

4. Erratum;Surface and Interface Analysis;2000

5. The ‘infinite velocity method’: a means of concentration calibration in secondary ion mass spectrometry?;Surface Science;1999-06

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