Author:
Rohrbach Eckhard,Hofmann Dieter,Koschar Peter,Groeneveld Karl-Ontjes,König Karl-Heinz
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
3 articles.
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1. Thickness measurements of thin films: comparison of techniques using characteristic X-ray line ratio techniques;Thin Solid Films;1992-07
2. Film thickness determination with PIXE;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1992-05
3. Target characterization by fast ion impact;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1989-10