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Implications of heavy-ion-induced satellite X-ray emission III

  • Published:1984-04 Issue:1-3 Volume:3 Page:88-93
  • ISSN:0168-583X
  • Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
  • language:en
  • Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Vane C.R.,Hulett L.D.,Kahane S.,Mcdaniel F.D.,Milner W.T.,O'kelley G.D.,Raman S.,Rosseel T.M.,Slaughter G.G.,Varghese S.L.,Young J.P.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Cited by 10 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Study of ion beam induced chemical effects in silicon with a downsized high resolution X-ray spectrometer for use with focused ion beams;Journal of Analytical Atomic Spectrometry;2016

2. High resolution PIXE instrumentation survey. Part III;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-04

3. High-resolution study of theKβ2x-ray spectra induced by proton and photon impact on Zr, Mo, and Pd targets;Physical Review A;1995-10-01

4. High-resolution HIXSE studies of the chemical environment of sulfur implanted in quartz glass;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1989-08

5. Ion Induced X-ray Emission;Ion Beans for Materials Analysis;1989
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