Author:
Al Neami A.,Al Neami A.Kadom,Bordas M.,Hage-Ali M.,Larcher J.,Siffert P.,Heitz C.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
8 articles.
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1. Trace Analysis by Heavy Ion Induced X-Ray Emission;Microchimica Acta;2000-06-19
2. Energy straggling induced errors in heavy-ion PIXE analysis;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1998-03
3. Light ion induced damage in CdTe and Hg(1 − x)Cd(x)Te epitaxial thin films;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-06
4. Application of MeV carbon ions for PIXE measurements in silicon and high-Tc superconductors;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-04
5. Application of a MeV nickel ion beam for PIXE analysis of iron near the surface of a silicon wafer;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1995-05