Application of a new algorithm to depth profiling by PIXE-Reference-Cited by-同舟云学术

Application of a new algorithm to depth profiling by PIXE

Published:1995-12 Issue:4 Volume:103 Page:489-493
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Midy Pierre,Brissaud Ivan

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference13 articles.

Cited by 17 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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