Evaluation of depth profiling with PIXE
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference30 articles.
1. Full‐range solution for the measurement of thin‐film surface densities with proton‐excited x rays
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1. Particle-Induced X-Ray Emission (PIXE) Of Silicate Coatings On High Impact Resistance Polycarbonates;AIP Conference Proceedings;2011
2. Chemical Applications of Ion Accelerators;Handbook of Nuclear Chemistry;2011
3. PIXE depth profiling using variation of detection angle;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2006-08
4. Chemical Applications of;Handbook of Nuclear Chemistry;2003
5. Characterization of the interface between hydroxyapatite coating film and bone: use of a new expression to correct matrix effects for PIXE measurements in thick samples embedded in resin;Journal of Physics D: Applied Physics;2000-02-08
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