Ion-induced Auger emission and sputtering processes in solids
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference17 articles.
1. Spectres auger et sections efficaces d'ionisation de la couche L23 du magnésium et de l'aluminium sous impact de protons et d'ions lourds (10–100 keV)
2. Auger spectra induced by Ne+and Ar+impact on Mg, Al, and Si
3. Secondary ion and Auger electron emissions from Ar+-ion-sputtered FeAl alloys
4. Observation of a new atomic-like peak in the ion-induced Auger spectrum of Si
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1. Depth resolution in sputter depth profiling-characterization of a third batch of tantalum pentoxide on tantalum certified reference material by AES and SIMS;Surface and Interface Analysis;2000-01
2. Atomic Spectrometry Update—Advances in Atomic Absorption and Fluorescence Spectrometry and Related Techniques;J. Anal. At. Spectrom.;1993
3. Electron Emission from Silicon Induced by Bombardment with Oxygen Ions;NATO ASI Series;1993
4. A SIMS instrument with electron and ion induced Auger electron detection;Measurement Science and Technology;1992-11-01
5. Caesium-ion-induced Auger emission from aluminium and silicon;Surface and Interface Analysis;1992-06
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