The effect of ion beam mixing on SIMS depth resolution-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

The effect of ion beam mixing on SIMS depth resolution

Published:1992-02 Issue:1-4 Volume:64 Page:149-152
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Likonen J.,Hautala M.,Koponen I.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference26 articles.

1. Sputtering of PtSi

2. Depth-profiling of Cu-Ni sandwich samples by secondary ion mass spectrometry

3. Influence of ion mixing on the depth resolution of sputter depth profiling

4. Low energy ion beam mixing of metal-copper multilayers

5. The depth resolution of sputter profiling

Cited by 13 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Maximum Ti concentrations in Si quantified with atom probe tomography (APT);Journal of Applied Physics;2021-05-07

2. Fluorine Gas Coinjection as a Solution for Enhancing Spatial Resolution of Time-of-Flight Secondary Ion Mass Spectrometry and Separating Mass Interference;Analytical Chemistry;2019-12-20

3. Incorporation of gold into silicon by thin film deposition and pulsed laser melting;Applied Physics Letters;2016-12-05

4. Surface restructuring in sputter-damaged Bi2Sr2CaCu2O8+δ;Physical Review B;2011-10-07

5. The simulation of nanoscale sputter depth profiles using molecular dynamics;Applied Surface Science;2009-05

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP