Ultrahigh-resolution studies of heavy-ion-induced X-ray satellite emission

Author:

Vane C.R.,Källne E.,Källne J.,Morford G.,Raman S.,Smith M.S.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Cited by 14 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Chemical state analysis employing sub-natural linewidth resolution PIXE measurements of Kα diagram lines;X-Ray Spectrometry;2005

2. High energy resolution PIXE analysis using focused MeV heavy ion beams;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1998-03

3. Ta, Au and Th L X-ray energy shifts and yields induced by 0.6, 1.2, 2.4 and 4 MeV/nucleon Kr ions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1998-03

4. High resolution PIXE instrumentation survey. Part III;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-04

5. Imaging-Plate X-Ray Spectrometer for High-Resolution Particle-Induced X-Ray Emission.;Analytical Sciences;1993

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