Author:
Leavitt J.A.,McIntyre L.C.,Ashbaugh M.D.,Cox R.P.,Lin Z.,Gregory R.B.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
8 articles.
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1. Determination of stoichiometry in silicon carbide materials using elastic backscattering spectrometry;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2007-07
2. Characterization and corrosion stability of SiC coatings using ion beam analysis techniques;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2006-03
3. Ion beam analysis of porous silicon layers;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2001-06
4. Quantitative analysis of a-Si1−xCx:H thin films;Applied Surface Science;1999-04
5. 12C(α,α)12C resonant elastic scattering at 5.7 MeV as a tool for carbon quantification in silicon-based heterostructures;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1998-09