Author:
Arps James H.,Weller Robert A.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
9 articles.
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1. Characterization and production metrology of thin transistor gate oxide films;Materials Science in Semiconductor Processing;1999-07
2. Determination of the hydrogen sensitivity and depth resolution of medium-energy, time-of-flight, forward-recoil spectrometry;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-12
3. Introduction;Forward Recoil Spectrometry;1996
4. Time-of-flight elastic recoil analysis of ion beam modified nitrocellulose thin films;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1995-06
5. Medium energy ion beam analysis and modification of Langmuir-Blodgett thin films;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1995-05