Author:
Russo S.P.,Johnston P.N.,Elliman R.G.,Dooley S.P.,Jamieson D.N.,Pain G.N.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
6 articles.
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1. Light ion induced damage in CdTe and Hg(1 − x)Cd(x)Te epitaxial thin films;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-06
2. Nuclear microprobe analysis of Hg1−xCdxTe metal–semiconductor–metal detectors on substrates of GaAs and GaAs/Si;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1995-01
3. Focused MeV light ion beams for high resolution channeling contrast imaging;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1994-03
4. Determination of composition, thickness and growth rate profiles of MOCVD grown Hg-xCdxTe;Journal of Crystal Growth;1993-07
5. Study of MOCVD grown Hg1−xCdxTe by ion beam techniques;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1993-06