Author:
Mohadjeri B.,Svensson B.G.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
3 articles.
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1. Secondary ion mass spectrometry depth profiling of 59Co implanted into nickel;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2003-07
2. Simplified methodology of the ultra-thin layer activation technique;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2002-05
3. Atomic Spectrometry Update—Advances in Atomic Absorption and Fluorescence Spectrometry and Related Techniques;J. Anal. At. Spectrom.;1993