Author:
Ecker K.H.,Quan Z.,Schurig T.,Weise H.P.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
5 articles.
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1. The Use of Medium-Energy Atom Beams for Solid-State PIXE Diagnostics;Technical Physics;2021-01
2. Considerations about PIXE analysis under channeling conditions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2005-10
3. Channeling contrast microscopy of GaN and InGaN thin films;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1999-09
4. Micro-PIXE and channeling PIXE analysis of Ag-doped YBa2Cu3O7−δ thin films;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1999-04
5. Characteristics of PIXE channeling and its application to ZnSe thin films;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1998-12