Epitaxial growth analysis of YBaCuO thin films by ion backscattering and channeling spectrometry-Reference-Cited by-同舟云学术

Epitaxial growth analysis of YBaCuO thin films by ion backscattering and channeling spectrometry

Published:1990-01 Issue:1-4 Volume:45 Page:483-487
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Meyer O.,Geerk J.,Li Q.,Linker G.,Xi X.X.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference11 articles.

1. Backscattering Spectrometry;Chu,1978

2. Materials Analysis by Ion Channeling;Feldman,1982

Cited by 17 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

2. High resolution RBS study of the growth and the crystalline quality of ultrathin YBaCuO films;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-09

3. Channeling studies of YBaCuO thin films with combined RBS and PIXE;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-09