A simple soft X-ray (1 < λ < 11 nm) spectrometer for relative line intensity measurements in charge exchange studies

Author:

Fleury A.,Debernardi J.,Bonnefoy M.,Bliman S.,Bonnet J.J.,Chassevent M.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

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3. High resolution PIXE instrumentation survey. Part III;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-04

4. L'émission X des ions multichargés N7+, O8+, en interaction avec une surface métallique;Annales de Physique;1994-10

5. Dielectronic recombination versus charge exchange: Electron capture by metastable ions;Physical Review A;1994-10-01

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