Performance of a time-of-flight spectrometer for thin film analysis by medium energy ion scattering-Reference-Cited by-同舟云学术

Performance of a time-of-flight spectrometer for thin film analysis by medium energy ion scattering

Published:1990-04 Issue:2 Volume:47 Page:193-201
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Mendenhall Marcus H.,Weller Robert A.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference14 articles.

1. Backscattering Spectrometry;Chu,1979

2. Angle resolved detection of charged particles with a novel type toroidal electrostatic analyser

3. A time-of-flight spectrometer for medium energy ion scattering

4. Light elements depth-profiling using time-of-flight and energy detection of recoils

5. Time-of-flight system for slow heavy ions

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