Author:
Mendenhall Marcus H.,Weller Robert A.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
28 articles.
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1. Picosecond pulsed beams of light and heavy keV ions at the Time-of-Flight Medium energy ion scattering system at Uppsala University;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2024-11
2. A versatile time-of-flight medium-energy ion scattering setup using multiple delay-line detectors;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2020-01
3. Time-of-flight secondary ion mass spectrometry in the helium ion microscope;Ultramicroscopy;2019-03
4. Evaluation of depth resolution with time-of-flight medium energy backscattering;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2006-02
5. Interfacial analysis using time-of-flight medium energy backscattering;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2004-07