Author:
Turkenburg W.C.,Kersten H.H.,Colenbrander B.G.,De Jongh A.P.,Saris F.W.
Cited by
28 articles.
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1. Rutherford backscattering spectrometry: reminiscences and progresses;Materials Chemistry and Physics;1996-11
2. High resolution RBS study of the growth and the crystalline quality of ultrathin YBaCuO films;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-09
3. Delta doping in silicon;Critical Reviews in Solid State and Materials Sciences;1993-01
4. Probing the stopping power near the surface by specular reflection of protons from graphite;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1992-11
5. A time-of-flight spectrometer for medium energy ion scattering;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1989-04