Trace-impurity detection by Rutherford backscattering and nuclear resonance reactions

Author:

Maisch Th.,Schüle V.,Günzler R.,Oberschachtsiek P.,Weiser M.,Jans S.,Izsak K.,Kalbitzer S.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference16 articles.

1. XRFS and PIXE: Are they complementary or competitive techniques?

2. E. Pernicka, private communication.

3. Trace Analytical Capabilities of Total-Reflection X-Ray Flourescence Analysis

4. Proc. 4th Conf. on Scientific and Industrial Applications of Small Accelerators;Kalbitzer,1976

5. A multisegment annular Si-detector system for RBS analysis

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5. Incorporation of nitrogen in chemical vapor deposition diamond;Applied Physics Letters;1995-11-06

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