Author:
Günzler R.,Schüle V.,Seeliger G.,Weiser M.,Böhringer K.,Kalbitzer S.,Kemmer J.
Subject
Instrumentation,Nuclear and High Energy Physics
Reference13 articles.
1. Proc. 4th Conf. Scientific and Industrial Applications of Small Accelerators;Kalbitzer,1976
2. Proc. 2nd Int. Conf. Ion Beam Surface Layer Analysis;Feuerstein,1976
3. Nuclear microanalysis using MeV carbon ion backscattering; usefulness and applications
4. The detection sensitivity of heavy impurities in Si using 280 keV He2+ and C2+ back-scattering
5. paper presented at 12th Int. Conf. Atomic Collisions in Solids;Carstanjen,1987
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