PIXE induced XRF analysis of trace amounts of iron in pure copper matrix
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference8 articles.
1. The (pX, X) experiment — A new approach for partial sensitivity enhancement in trace element analysis
2. Ion Induced X-Rays for X-Ray Fluorescence Analysis
3. XSQR: The technique of pixe-induced XRF
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1. Proton induced quasi-monochromatic x-ray beams for soft x-ray spectroscopy studies and selective x-ray fluorescence analysis;Review of Scientific Instruments;2012-12
2. Precise analysis of PIXE induced XRF spectra with the aid of the Raman scattering;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-04
3. Interference peak intensities due to the Raman scattering in PIXE induced XRF;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-04
4. Feasibility of intense monochromatic x-ray source in the 1-100 keV range by proton bombardment of metallic targets;X-Ray Spectrometry;1995-03
5. PIXE-induced XRF analysis for trace amounts of Mn, Cr, V and Ti in low-alloy steels;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1994-11
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