On the correction for multiple scattering of linearly polarized X-rays in Compton profile measurements
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference30 articles.
1. ANISOTROPIE DES DENSITES DE MOMENTS ELECTRONIQUES DANS DES MONOCRISTAUX
2. An X-ray spectrometer for Compton scattering experiments with synchrotron radiation
3. Performance of a versatile instrumentation for inelastic X-ray scattering spectroscopy (IXSS) with synchrotron radiation
4. High‐resolution Compton profile spectrometer for 29.5‐keV x rays with a combination of crystal analyzer and imaging plate
5. High-Resolution Compton Profile of Si Using 29.5 keV Synchrotron-Radiation X-Rays
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