Performance of a versatile instrumentation for inelastic X-ray scattering spectroscopy (IXSS) with synchrotron radiation

Author:

Berthold A.,Mourikis S.,Schmitz J.R.,Schülke W.,Schulte-Schrepping H.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Cited by 36 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Background radiation in inelastic X-ray scattering and X-ray emission spectroscopy. A study for Johann-type spectrometers;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2018-06

2. Directional lithium hydride Compton profiles of 0.1% statistical accuracy;Journal of Synchrotron Radiation;2009-08-15

3. Crystal Spectrometers for Compton Scattering Studies;Zeitschrift für Physikalische Chemie;2006-07

4. Performance of a dispersion-compensating scanning X-ray spectrometer for Compton profile measurements;Journal of Synchrotron Radiation;2005-08-16

5. Improving the performance of high-resolution X-ray spectrometers with position-sensitive pixel detectors;Journal of Synchrotron Radiation;2005-06-15

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