Anomalous depth profiles of light ions and noble gases implanted into polymers

Author:

Guimarães R.B.,Amaral L.,Behar M.,Zawislak F.C.,Fink D.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Cited by 12 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Angle-resolved XPS study of the effect of x-radiation on the aging of polystyrene exposed to an oxygen/argon plasma;Surface and Interface Analysis;2002-01

2. Anomalous depth profiles and diffusional behavior of noble gases implanted into photoresist films;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-08

3. Diffusion study of Kr, Rb and Xe implanted into positive and negative photoresist films;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-04

4. Range profiles of implanted argon ions in polymers;Radiation Effects and Defects in Solids;1994-05

5. Thermal diffusion study of Xe and Cs implanted into a polymer film;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1994-05

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