Ion reflection analysis of the surface topography induced by ion bombardment of a hot metal target-Reference-Cited by-同舟云学术

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Ion reflection analysis of the surface topography induced by ion bombardment of a hot metal target

Published:1988-06 Issue:1-4 Volume:33 Page:564-568
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Budzioch J.,Soszka M.,Soszka W.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference11 articles.

1. Angular distribution measurements of sputtered atoms with characteristic X-ray emission

2. Proc. 7th Int. Conf. on Phenomena in Ionized Gases;Parilis,1965

3. Medium-Energy Ion Reflection from Solids;Mashkova,1985

4. Surface texture induced by heavy ion bombardment: Ion reflection analysis

5. The Stopping and Range of Ions in Solids;Ziegler,1985

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Krypton Saturation of the Metal Surface during Kr+ Ion Bombardment Determined Due to Autoionization Electron Analysis;Physica Status Solidi (a);1989-03-16

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