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Radioisotope induced x-ray emission — a complementary method to pixe analysis

  • Published:1986-01 Issue:1 Volume:14 Page:93-98
  • ISSN:0168-583X
  • Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
  • language:en
  • Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Heitz C.,Lagarde G.,Pape A.,Tenorio D.,Zarate C.,Menu M.,Scotee L.,Jaidar A.,Alviso R.,Gonzalez D.,Gonzalez V.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference7 articles.

Cited by 11 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Incompatible elements in bottom sediments of the Itaipú Dam Reservoir by EDXRF;Journal of Radioanalytical and Nuclear Chemistry;2018-03-17

2. Special Ion Beam Applications in Materials Analysis Problems;Ion Beams in Materials Processing and Analysis;2012

3. PIXE and EDXRF studies on banded iron formations from eastern India;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2004-01

4. Comparative methods for determination of rare earths in geological and mineral samples;Journal of Radioanalytical and Nuclear Chemistry Articles;1994-08

5. Measurement of composition of thin films obtained by sputtering using radioisotope excited X-ray fluorescence;X-Ray Spectrometry;1994-07
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