Author:
Haring R.A.,Roosendaal H.E.,Zalm P.C.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
48 articles.
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1. Mass scale calibration of TOF-SIMS spectra with molecular ions of internal additives;Surface and Interface Analysis;2016-08-15
2. Molecule emission from condensed Ar and O 2 targets by 750 eV Ne impact;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2015-06
3. Mass-scale calibration of TOF-SIMS spectra using quaternary ammonium ions;Surface and Interface Analysis;2014-06-11
4. Reply;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2013-05
5. Towards quantitative depth profiling with high spatial and high depth resolution;Applied Surface Science;2008-12