Scattering recoil coincidence spectrometry: A new experimental technique for profiling hydrogen isotopes in low-Z thin films-Reference-Cited by-同舟云学术

Scattering recoil coincidence spectrometry: A new experimental technique for profiling hydrogen isotopes in low-Z thin films

Published:1990-01 Issue:1-4 Volume:45 Page:176-180
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Forster J.S.,Leslie J.R.,Laursen T.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference10 articles.

3. J.S. Forster, J.R. Leslie and T. Laursen, to be published.

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5. Depth profiling of hydrogen isotopes in thin, low-Z films by scattering recoil coincidence spectrometry;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1992-03