Depth profiling of hydrogen isotopes in thin, low-Z films by scattering recoil coincidence spectrometry-Reference-Cited by-同舟云学术

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Depth profiling of hydrogen isotopes in thin, low-Z films by scattering recoil coincidence spectrometry

Published:1992-03 Issue:1-2 Volume:66 Page:215-220
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Forster J.S.,Leslie J.R.,Laursen T.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference10 articles.

1. Scattering recoil coincidence spectrometry: A new experimental technique for profiling hydrogen isotopes in low-Z thin films

2. Ion backscattering studies of the liquid-solid interface

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Conventional Recoil Spectrometry;Forward Recoil Spectrometry;1996

2. Introduction;Forward Recoil Spectrometry;1996

3. Coincidence Techniques;Forward Recoil Spectrometry;1996

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