Author:
Thomas J.P.,Oladipo A.,Fallavier M.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
19 articles.
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1. Incident Energy Dependence of the Molecular Orientation Effect of MeV \(\text{C}_{2}^{ + }\) Projectiles in Secondary-Ion Emission Processes;Journal of the Physical Society of Japan;2022-02-15
2. Sputtering and defect production by focused gold cluster ion beam irradiation of silicon;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1997-12
3. Track separation due to dissociation of MeV C60 inside a solid;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1997-10
4. MeV ion sputtering of polymers: observation of a secondary ion emission dependence on the crystallinity of PEEK and PET films;International Journal of Mass Spectrometry and Ion Processes;1997-10
5. MeV-cluster impacts and related phenomena;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-08