Thin layer analysis with heavy ion RBS-Reference-Cited by-同舟云学术

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Thin layer analysis with heavy ion RBS

Published:1994-05 Issue:1-4 Volume:89 Page:174-177
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Döbeli M.,Lombao A.,Vetterli D.,Suter M.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference5 articles.

1. Backscattering Spectrometry;Chu,1978

2. A position-sensitive transmission time detector

3. Heavy ion backscattering analysis with a time-of-flight detector

4. A time-of-flight detector for heavy ion RBS

5. The Stopping and Range of Ions in Solids;Ziegler,1985

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Cryogenic heavy ion RBS-ERDA depth profiling of ion implanted PET films;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2024-01

2. Design of an automated particle detection system for Rutherford backscattering (RBS) using LabVIEW;Instrumentation Science & Technology;2018-11-29

3. Radiation detector resolution over a continuous energy range;Applied Physics Letters;2007-08-27

4. Time-of-flight telescope for heavy-ion RBS;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2007-08

5. Ion-beam characterization in superlattices;Handbook of Thin Films;2002

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