A time-of-flight detector for heavy ion RBS

Author:

Döbeli M.,Haubert P.C.,Livi R.P.,Spicklemire S.J.,Weathers D.L.,Tombrello T.A.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Cited by 10 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Heavy-Ion Backscattering Spectrometry;Characterization of Materials;2012-10-12

2. Thin Film Characterisation Using MeV Ion Beams;Ion Beams in Nanoscience and Technology;2009

3. Rutherford Backscattering Spectroscopy;Encyclopedia of Analytical Chemistry;2006-09-15

4. Medium energy ion-nanoprobe with TOF-RBS for semiconductor process analysis;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2002-05

5. Influence of heavy ion irradiation damage on silicon charged particle detector calibration;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2000-03

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