Thick target X-ray yields and intensity ratios for MeV Br and Kr ion impact and application to the analysis of pottery-Reference-Cited by-同舟云学术

Thick target X-ray yields and intensity ratios for MeV Br and Kr ion impact and application to the analysis of pottery

Published:1986-04 Issue:1-6 Volume:15 Page:612-615
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Tenorio D.,Costa G.,Bordas M.,Larcher J.,Lagarde G.,Heitz C.,Jaidar A.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference16 articles.

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3. Heavy-ion induced K-shell ionization for elements 22 ≤ Z ≤ 28;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1988-12

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