Comparison of various ions for use in heavy ion induced X-ray emission
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference19 articles.
1. K-Shell Ionization in Heavy-Ion Collisions
2. Argon ion induced X-ray analysis of silicon and chlorine in cadmium telluride
3. Thick target X-ray yields and intensity ratios for MeV Br and Kr ion impact and application to the analysis of pottery
4. Choice of physical parameters in charged particle induced X-ray fluorescence analysis
5. Quantitative trace element analyses in thick samples with heavy‐ion‐induced x‐ray fluorescence
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1. Au L-shell x-ray emission induced by 154.3–423.9 MeV/u C6+ ions;Scientific Reports;2022-11-10
2. W L-shell X-ray emission induced by C<sup>6+ </sup>ions with several hundred MeV/u;Acta Physica Sinica;2022
3. Thin film nanolaminate analysis by simultaneous heavy ion recoil and X-ray spectrometry;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2004-06
4. Trace Analysis by Heavy Ion Induced X-Ray Emission;Microchimica Acta;2000-06-19
5. Stopping power measurements of 0.5–10.5 MeV 7Li ions in polyimide, vyns, formvar, and polysulfone;Journal of Applied Physics;1999-10
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