Author:
Devine R.A.B.,Warren W.L.,Shaneyfelt M.R.,Fleetwood D.M.,Aspar B.
Subject
Instrumentation,Nuclear and High Energy Physics
Reference11 articles.
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2. Comparative study of radiation‐induced electrical and spin active defects in buried SiO2layers
3. SIMOX with epitaxial silicon: point defects and positive charge
4. A. Stesmans and K. Vanheusden, in: Amorphous Insulating Thin Films eds. J. Kanicki, W.L. Warren, R.A.B. Devine and M. Matsumura (Mater. Res. Soc. Symp. Proc. 284) in press.
5. Excess‐Si related defect centers in buried SiO2thin films
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