An ultra-high vacuum reflection scanning electron diffraction system
Author:
Publisher
Elsevier BV
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation
Reference21 articles.
1. THE OBSERVATION OF GAS ADSORPTION PHENOMENA BY REFLECTION HIGH‐ENERGY ELECTRON DIFRACTION
2. COMPARISON OF LOW‐ENERGY ELECTRON DIFFRACTION AND LOW‐ANGLE, HIGH‐ENERGY ELECTRON DIFFRACTION TECHNIQUES FOR THE OBSERVATION OF CHEMISORPTION
3. Quantitative reflection electron diffraction in an ultra high vacuum camera
4. n-Beam dynamical diffraction of high-energy electrons at glancing incidence. General theory and computational methods
5. Comparison of experimental andn-beam calculated intensities for glancing incidence high-energy electron diffraction
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1. Monitoring the growth of III-nitride materials by plasma assisted molecular beam epitaxy employing diffuse scattering of RHEED;Journal of Vacuum Science & Technology B;2020-01
2. Ultrahigh vacuum picosecond laser‐driven electron diffraction system;Review of Scientific Instruments;1990-06
3. Video system for quantitative measurements of RHEED patterns;Review of Scientific Instruments;1986-07
4. Simultaneous RHEED / AES study of Si film growth on Si(111) and sapphire (11̄02) surfaces;Surface Science;1979-07
5. Scanning electron diffraction and its application to the oxidation of iron;Corrosion Science;1976-01
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