Spectral ellipsometric TEM and electron spectroscopic investigations on oxidized aluminium thin films
Author:
Publisher
Elsevier BV
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation
Reference30 articles.
1. Electron microscopic and ellipsometric studies on oxidized aluminium layers
2. Ellipsometric and X-ray specular reflection studies on naturally grown overlayers on aluminium thin films
3. Effect of surface roughness on ellipsometry of aluminum
4. Structure of the Al/Al2O3interface
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2. Preparation of thin AlOx (0 ≤x ≤ 1.5) films on gold and polycarbonate characterized by XPS, EPMA, AFM and TEM;Surface and Interface Analysis;1994-08
3. Surface plasmon resonance as a technique to study adsorption to aluminum oxide surfaces;Berichte der Bunsengesellschaft für physikalische Chemie;1992-07
4. Determination of the optical constants of metals and semiconductors by combining ellipsometry with electron spectroscopy microscopy and X-ray specular reflection analysis;Surface Science;1988-07
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