1. Trace anion determination in concentrated hydrofluoric acid solutions by two-dimensional ion chromatography
2. Book of SEMI International Standards 2004, Chemical Reagents Volume, Semiconductor Equipment and Materials International, Mountain View, CA, 2004, C28-0704.
3. Ion-chromatographic study of interactions in HF–H3PO4–HNO3 semiconductor etchants
4. Book of SEMI International Standards 2004, Chemical Reagents Volume, Semiconductor Equipment and Materials International, Mountain View, CA, 2004, C1-0704.
5. Book of SEMI International Standards 2004, Chemical Reagents Volume, Semiconductor Equipment and Materials International, Mountain View, CA, 2004, C10-0299.