Author:
Krammer M.,Adam W.,Berdermann E.,Bergonzo P.,Bertuccio G.,Bogani F.,Borchi E.,Brambilla A.,Bruzzi M.,Colledani C.,Conway J.,D'Angelo P.,Dabrowski W.,Delpierre P.,Deneuville A.,Dulinski W.,van Eijk B.,Fallou A.,Fizzotti F.,Foulon F.,Friedl M.,Gan K.K.,Gheeraert E.,Hallewell G.,Han S.,Hartjes F.,Hrubec J.,Husson D.,Kagan H.,Kania D.,Kaplon J.,Kass R.,Koeth T.,Logiudice A.,Lu R.,MacLynne L.,Manfredotti C.,Meier D.,Mishina M.,Moroni L.,Oh A.,Pan L.S.,Pernicka M.,Peitz A.,Perera L.,Pirollo S.,Procario M.,Riester J.L.,Roe S.,Rousseau L.,Rudge A.,Russ J.,Sala S.,Sampietro M.,Schnetzer S.,Sciortino S.,Stelzer H.,Stone R.,Suter B.,Tapper R.J.,Tesarek R.,Trischuk W.,Tromson D.,Vittone E.,Walsh A.M.,Wedenig R.,Weilhammer P.,Wetstein M.,White C.,Zeuner W.,Zoeller M.
Subject
Electrical and Electronic Engineering,Materials Chemistry,Mechanical Engineering,General Chemistry,Electronic, Optical and Magnetic Materials
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