Metrological characterization of X-ray diffraction methods for determination of crystallite size in nano-scale materials-Reference-Cited by-同舟云学术

Metrological characterization of X-ray diffraction methods for determination of crystallite size in nano-scale materials

Published:2007-10 Issue:10 Volume:58 Page:883-891
ISSN:1044-5803
Container-title:Materials Characterization
language:en
Short-container-title:Materials Characterization

Author:

Uvarov V.,Popov I.

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference24 articles.

1. X-ray diffraction procedures for polycrystalline and amorphous materials.;Klug,1974

2. Diffraction analysis of the microstructure of materials;Mittemeijer,2004

3. Determination of crystallite size and lattice distortions through X-ray diffraction line profile analysis. Recipes, methods and comments;Delhez;J Anal Bioanal Chem,1982

4. The big problem of small particles: a comparison of methods for determination of particle size in nanocrystalline anatase powders;Weibel;Chem Mater,2005

5. Comparison of X-ray analysis methods used to determine the grain size and strain in nanocrystalline materials;Tian;Philos Mag, A,1999

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