Comparison of X-ray analysis methods used to determine the grain size and strain in nanocrystalline materials
Author:
Publisher
Informa UK Limited
Subject
Metals and Alloys,Physics and Astronomy (miscellaneous),Condensed Matter Physics,General Materials Science,Electronic, Optical and Magnetic Materials
Link
http://www.tandfonline.com/doi/pdf/10.1080/01418619908210391
Reference38 articles.
1. Profile fitting of X-ray diffraction lines and Fourier analysis of broadening
2. Reliability of the Simplified Integral-Breadth Methods in Diffraction Line-Broadening Analysis
3. The Fitting of Powder Diffraction Profiles to an Analytical Expression and the Influence of Line Broadening Factors
4. Determination of crystallite size and lattice distortions through X-ray diffraction line profile analysis
5. Corrections for the angle dependence of Lorentz polarization and structure factors in X-ray diffraction line profiles
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