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Determining crystallographic orientation via hybrid convolutional neural network

  • Published:2021-08 Issue: Volume:178 Page:111213
  • ISSN:1044-5803
  • Container-title:Materials Characterization
  • language:en
  • Short-container-title:Materials Characterization

Author:

Ding Zihao,Zhu Chaoyi,De Graef Marc

Funder

Carnegie Mellon University

National Science Foundation

US Department of Defense

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference60 articles.

1. Physical Properties of Crystals: Their Representation by Tensors and Matrices;Nye,1985

2. Three-dimensional x-ray structural microscopy with submicrometre resolution;Larson;Nature,2002

3. High-energy x-ray diffraction microscopy in materials science;Bernier;Annu. Rev. Mater. Sci.,2020

4. Dark-field x-ray microscopy for multiscale structural characterization;Simons;Nat. Commun.,2015

5. Electron Backscatter Diffraction in Materials Science;Schwartz,2009
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