An assessment of errors in sample preparation and data processing for nanoparticle size analyses by AFM-Reference-Cited by-同舟云学术

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An assessment of errors in sample preparation and data processing for nanoparticle size analyses by AFM

Published:2015-11 Issue: Volume:109 Page:198-205
ISSN:1044-5803
Container-title:Materials Characterization
language:en
Short-container-title:Materials Characterization

Author:

Souza T.G.F.,Ciminelli V.S.T.,Mohallem N.D.S.

Funder

National Council for Scientific and Technological Development (CNPq)

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference29 articles.

1. Study of individual Na-montmorillonite particles size, morphology, and apparent charge

2. A comparison of atomic force microscopy (AFM) and dynamic light scattering (DLS) methods to characterize nanoparticle size distributions

3. A review of atomic force microscopy imaging systems: application to molecular metrology and biological sciences

4. Influence of atomic force microscopy acquisition parameters on thin film roughness analysis

5. Aspects of scanning force microscope probes and their effects on dimensional measurement

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3. Acetylated cashew gum and fucan for incorporation of lycopene rich extract from red guava (Psidium guajava L.) in nanostructured systems: Antioxidant and antitumor capacity;International Journal of Biological Macromolecules;2021-11

4. Analysis of Data Gleaned by Atomic-Force Microscopy;The World of Nano-Biomechanics;2017

5. Characterization of Gd loaded chitosan-TPP nanohydrogels by a multi-technique approach combining dynamic light scattering (DLS), asymetrical flow-field-flow-fractionation (AF4) and atomic force microscopy (AFM) and design of positive contrast agents for molecular resonance imaging (MRI);Nanotechnology;2016-12-28

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