Simultaneous probing of phase transformations in Ni-Ti thin film shape memory alloy by synchrotron radiation-based X-ray diffraction and electrical resistivity-Reference-Cited by-同舟云学术

Simultaneous probing of phase transformations in Ni-Ti thin film shape memory alloy by synchrotron radiation-based X-ray diffraction and electrical resistivity

Published:2013-02 Issue: Volume:76 Page:35-38
ISSN:1044-5803
Container-title:Materials Characterization
language:en
Short-container-title:Materials Characterization

Author:

Braz Fernandes F.M.,Mahesh K.K.,Martins R.M.S.,Silva R.J.C.,Baehtz C.,von Borany J.

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference13 articles.

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3. Deposition and characterization of TiNi-base thin films by sputtering;Chu;Mat Sci Eng A Struct,2000

4. Structural characterization of NiTi thin film shape memory alloys;Braz Fernandes;Sens Actuators A Phys,2002

5. Structural in-situ studies of Shape Memory Alloy (SMA) Ni–Ti thin films;Martins;Nucl Instrum Methods B,2005

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