Automated crystal orientation and phase mapping in TEM

Author:

Rauch E.F.,Véron M.

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference46 articles.

1. Electron backscatter diffraction: strategies for reliable data acquisition and processing;Randle;Mater. Charact.,2009

2. Review: grain and subgrain characterisation by electron backscatter diffraction;Humphreys;J. Mater. Sci.,2001

3. Rapid spot diffraction patterns identification through template matching;Rauch;Arch. Metall. Mater.,2005

4. Coupled microstructural observations and local texture measurements with and automated crystallographic orientation mapping tool attached to a TEM;Rauch;J. Mater. Sci. Eng. Technol.,2005

5. Microstructural characterization of a fine-grained ultra low carbon steel;Mathis;Mater. Sci. Eng. A,2007

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