Recent developments in scanning electron microscope design-Reference-Cited by-同舟云学术

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Recent developments in scanning electron microscope design

Published:2001 Issue: Volume: Page:197-285
ISSN:1076-5670
Container-title:Advances in Imaging and Electron Physics
language:
Short-container-title:

Author:

Khursheed Anjam

Publisher

Elsevier

Reference38 articles.

1. Low-voltage probe forming columns for electrons;Beck;Nuclear Instruments and Methods in Physics Research,1995

2. Picosecond photoemission probing;Beha,1993

3. Microminiaturization of electron optical systems;Chang;J. Vac. Sci. Technol.,1990

4. Electron sources for electron microscopes;Delong;Microscopy and Analysis,1993

5. A high-resolution time-dispersive electron spectrometer for fast voltage-contrast measurements;Dinnis;Microelectronics Engineering,1996

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1. Compact and Low-Cost Scanning Electron Microscope;2024 37th International Vacuum Nanoelectronics Conference (IVNC);2024-07-15

2. Finite Element Analysis of Scanning Electron Microscope Illumination System;Arabian Journal for Science and Engineering;2024-01-05

3. Notes and References;Principles of Electron Optics;2018

4. Ultimate resolution limits for scanning electron microscope immersion objective lenses;Optik;2002

5. Permanent magnet objective lenses for multicolumn electron-beam systems;Review of Scientific Instruments;2001-04

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